• Dec 24, 2021 News!Vol 10, No 1- Vol 10, No 2 has been indexed by IET-(Inspec)   [Click]
  • Aug 27, 2020 News!Welcome Prof. D. P. Sharma from India to join the Editorial board of IJFCC     [Click]
  • Aug 18, 2022 News!Vol.11, No.3 has been published with online version.     [Click]
General Information
Editor-in-chief

Prof. Pascal Lorenz
University of Haute Alsace, France
 
It is my honor to be the editor-in-chief of IJFCC. The journal publishes good papers in the field of future computer and communication. Hopefully, IJFCC will become a recognized journal among the readers in the filed of future computer and communication.

IJFCC 2012 Vol.1(2): 106-110 ISSN: 2010-3751
DOI: 10.7763/IJFCC.2012.V1.28

Automatic Generation of Systematic Test Cases Using AADL for Embedded Software

Chunyan Ma, Yue Li, Yunwei Dong, and Yaqi Liu
Abstract—AADL is used to design embedded software in ever-increasing mission-critical applications. With the complexity of embedded software increasing, integration testing and system testing based on codes are becoming more difficult. This paper describes a systematic test cases generation approach using AADL for embedded software. The approach uses hierarchical testing model to generate test cases which is fully automatic model-driven. This paper designs one set of mapping rules from AADL to hierarchical testing model for constructing it automatically. The case study shows experimental process of the test model construction and test case generation. Automatic generation of systematic test cases using AADL for Embedded Software is feasible.

Index Terms—AADL, test cases generation, hierarchical testing model.

Chunyan Ma is with School of Software and Microelectronics, Northwestern Polytechnical University, Xi’an, China (e-mail: machunyan@nwpu.edu.cn).
Yue Li and Yunwei Dong are with School of Computer Science, Northwestern Polytechnical University, Xi‟an, China
Yaqi Liu is with Institute of Computing Technology Chinese Academy of Sciences, Beijing, China

[PDF]

Cite: Chunyan Ma, Yue Li, Yunwei Dong, and Yaqi Liu, "Automatic Generation of Systematic Test Cases Using AADL for Embedded Software," International Journal of Future Computer and Communication vol. 1, no. 2, pp. 106-110, 2012.
Copyright © 2008-2022. International Journal of Future Computer and Communication. All rights reserved.
E-mail: ijfcc@ejournal.net