Abstract—AADL is used to design embedded software in ever-increasing mission-critical applications. With the complexity of embedded software increasing, integration testing and system testing based on codes are becoming more difficult. This paper describes a systematic test cases generation approach using AADL for embedded software. The approach uses hierarchical testing model to generate test cases which is fully automatic model-driven. This paper designs one set of mapping rules from AADL to hierarchical testing model for constructing it automatically. The case study shows experimental process of the test model construction and test case generation. Automatic generation of systematic test cases using AADL for Embedded Software is feasible.
Index Terms—AADL, test cases generation, hierarchical testing model.
Chunyan Ma is with School of Software and Microelectronics, Northwestern Polytechnical University, Xi’an, China (e-mail: machunyan@nwpu.edu.cn).
Yue Li and Yunwei Dong are with School of Computer Science, Northwestern Polytechnical University, Xi‟an, China
Yaqi Liu is with Institute of Computing Technology Chinese Academy of Sciences, Beijing, China
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Cite: Chunyan Ma, Yue Li, Yunwei Dong, and Yaqi Liu, "Automatic Generation of Systematic Test Cases Using AADL for Embedded Software,"
International Journal of Future Computer and Communication vol. 1, no. 2, pp. 106-110, 2012.
