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General Information
Editor-in-chief

Prof. Pascal Lorenz
University of Haute Alsace, France
 
It is my honor to be the editor-in-chief of IJFCC. The journal publishes good papers in the field of future computer and communication. Hopefully, IJFCC will become a recognized journal among the readers in the filed of future computer and communication.

IJFCC 2013 Vol.2(6): 585-589 ISSN: 2010-3751
DOI: 10.7763/IJFCC.2013.V2.232

Establishing a Defect Management Process Model for Software Quality Improvement

Hafiz Ansar Khan

Abstract—Defect remains in the whole life of software because software is developed by humans and ‘to err is human’. The main goal of well-organized software defect management process is to produce quality software with the least number of defects to reduce the impact of problems in the organization. Defect management process includes three levels which are defect detection, defect analysis and defect prevention to eliminate and mitigate the potential defects. At first level test the software work product until the entire defects are identified and fixed. The second level is defect analysis in this level previously identified defects are analyzed and time is spent to look their root causes and why they were not detected earlier. The ultimate goal of third level defect prevention is to prevent the defects from recurring in the future. The research question of this study is how to produce quality software with the least number of defects? A well establish a defect management process is one of the success factors of producing a software system within the time and budget. In this paper author have proposed a defect management process model and finds observations by applying the proposed model in one of the case organization. The major contribution of this study is to establish a defect management process model in an organization to reduce the number of defects and produce a quality software product.

Index Terms—Defect management process model, ITIL defect management model, defect detection, defect analysis, defect prevention, radial analysis, ODC, MR classification, ODC-CC, RCA, FMEA, FTA.

Hafiz Ansar Khan is with Shaheed Zulfikar Ali Bhutto Institute of Science and Technology Islamabad, Pakistan (e-mail: ansar_1182@yahoo.com).

[PDF]

Cite:Hafiz Ansar Khan, "Establishing a Defect Management Process Model for Software Quality Improvement," International Journal of Future Computer and Communication vol. 2, no. 6, pp. 585-589, 2013.

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